BSI - BS EN IEC 60749-39
Semiconductor devices — Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
active, Most Current
| Organization: | BSI |
| Publication Date: | 31 March 2022 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 60749-39
March 31, 2022
Semiconductor devices — Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
A description is not available for this item.
December 29, 2006
Semiconductor devices Mechanical and climatic test methods Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
A description is not available for this item.