ETSI - ES 203 119-6
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
inactive
| Organization: | ETSI |
| Publication Date: | 1 March 2022 |
| Status: | inactive |
| Page Count: | 69 |
scope:
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present document is to serve as the basis for the development of TDL tools. The meta-model of TDL and the meanings of the meta-classes are described in ETSI ES 203 119-1 [1].
Document History
May 1, 2022
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present...
ES 203 119-6
March 1, 2022
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present...
August 1, 2020
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present...
June 1, 2020
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present...
June 1, 2018
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present...
April 1, 2018
Methods for Testing and Specification (MTS); The Test Description Language (TDL); Part 6: Mapping to TTCN-3
The present document specifies how the elements of the Test Description Language (TDL) should be mapped to Testing and Test Control Notation version 3 (TTCN-3) [2]. The intended use of the present...