AENOR - UNE-EN 60749-36
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
active, Most Current
| Organization: | AENOR |
| Publication Date: | 18 March 2004 |
| Status: | active |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-36
March 18, 2004
Semiconductor devices - Mechanical and climatic test methods -- Part 36: Acceleration, steady state
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