ECIA - EIA/ECA-364-59
TP-59A Low Temperature Test Procedure for Electrical Connectors and Sockets
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| Organization: | ECIA |
| Publication Date: | 1 August 2006 |
| Status: | inactive |
| Page Count: | 16 |
scope:
This standard established a test method for exposing electrical connectors and sockets to low temperature for a specified duration.
Object
The object of this test procedure is to provide a standardized method of exposing electrical connectors and sockets to sub-ambient temperatures. Measurements observations made before, during and after the exposure shall be specified in the referencing document and may assess functionality of connectors and sockets at low temperatures.
Document History
August 1, 2006
TP-59A Low Temperature Test Procedure for Electrical Connectors and Sockets
This standard establishes a test method for exposing electrical connectors and sockets to low temperature for a specified duration.
Object
The object of this test procedure is to provide a...
EIA/ECA-364-59
August 1, 2006
TP-59A Low Temperature Test Procedure for Electrical Connectors and Sockets
This standard established a test method for exposing electrical connectors and sockets to low temperature for a specified duration.
Object
The object of this test procedure is to provide a...
August 1, 2006
TP-59A Low Temperature Test Procedure for Electrical Connectors and Sockets
This standard establishes a test method for exposing electrical connectors and sockets to low temperature for a specified duration.
December 1, 1988
TP-59 Low Temperature Test Procedure for Electrical Connectors
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