AENOR - UNE-EN 60749-11
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
active, Most Current
| Organization: | AENOR |
| Publication Date: | 30 May 2003 |
| Status: | active |
| Page Count: | 10 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-11
May 30, 2003
Semiconductor devices - Mechanical and climatic test methods -- Part 11: Rapid change of temperature - Two-fluid-bath method.
A description is not available for this item.