scope:

The present document contains the Profile Test Specification (PTS) and the Test Case Library (TCL) for "New Generation DECT; Part 5: Additional feature set nr. 1 for extended wideband speech" (ETSI TS 102 527-5 [15]). The present document covers both the Portable (PT) and the Fixed (FT) Radio terminations.

The present document is defined as an extension of ETSI TS 102 841 [16], so the numbering and order of figures and tables in the present document is aligned with the corresponding numbering and order of figures and tables in ETSI TS 102 841 [16].This also applies to the numbering of tables in the annexes (and especially in annex A).

The Test Case Library (TCL) covers also some test cases for "DECT New Generation; Part 1; Wideband speech" (ETSI TS 102 527-1 [13]), "DECT New Generation; Part 3; Extended wideband speech" (ETSI TS 102 527-3 [14]) and for the "Generic Access Profile" (ETSI EN 300 444 [12]). This is done because such test cases are mandatory or especially relevant for New Generation DECT Part 5 (see ETSI TS 102 527-5 [15]), and are not covered by existing GAP test specifications.

Due to the ascending compatibility of DECT profiles, all New Generation DECT Part 5 devices (see ETSI TS 102 527-5 [15]), are required to be also compliant with "DECT New Generation; Part 3; Extended wideband speech" (see ETSI TS 102 527-3 [14]), "DECT New Generation; Part 1; Wideband speech" (ETSI TS 102 527-1 [13]) and with the "Generic Access Profile" (GAP, ETSI EN 300 444 [12]). Annex E of the present document specifies the modifications to GAP test cases for requirements and tests that are optional in GAP test specifications (see note), but that become mandatory to support the corresponding GAP features in New Generation DECT Part 5.

NOTE: The industry de-facto standard practice for ensuring the compliance to GAP [12] is the use of ETSI TBR 022 [i.4] amended by ETSI TBR 022/A1 [i.5], even although these two documents no longer have their initial regulatory significance. ETSI TBR 022 [i.4] relies on the GAP Profile Test Specification (ETSI EN 300 494 Parts 1 [i.6] to 3 [i.8]) and on the DECT Test Case Library (ETSI EN 300 497 Parts 1 [i.9] to 9 [i.17]). The GAP test suite also includes the GAP Profile Implementation Conformance Statement (PICS) (ETSI EN 300 474 Parts 1 [i.25] and 2 [i.26]) and the DECT Common Interface (CI) Profile Implementation Conformance Statement (PICS) (ETSI EN 300 476 Parts 1 [i.18] to 7 [i.24]).

The objective of the present document is to provide a basis for approval tests of NG DECT Part 5 [15] equipment giving a high probability of air interface inter-operability between different manufacturer's DECT equipment.