DSF/FPREN IEC 62037-8
Passive RF and microwave devices, intermodulation level measurement – Part 8: Measurement of passive intermodulation generated by objects exposed to RF radiation
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 13 |
| ICS Code (Components and accessories in general): | 33.120.01 |
scope:
This part of IEC 62037 defines a radiated passive intermodulation (PIM) test to determine PIM levels generated by a device or object when it is exposed to RF radiation. This test can be conducted on any material or object and is not limited to devices designed to propagate RF signals. This test can be conducted as either a near field or far field test as defined by the test specification.
Document History
January 9, 2023
Passive RF and microwave devices, intermodulation level measurement – Part 8: Measurement of passive intermodulation generated by objects exposed to RF radiation
IEC 62037-8:2022 defines a radiated passive intermodulation (PIM) test to determine PIM levels generated by a device or object when it is exposed to RF radiation. This test can be conducted on any...
Measurement of passive intermodulation generated by objects exposed to RF radiation
This part of IEC 62037 defines a radiated passive intermodulation (PIM) test to determine PIM levels generated by a device or object when it is exposed to RF radiation. This test can be conducted on...
DSF/FPREN IEC 62037-8
Passive RF and microwave devices, intermodulation level measurement – Part 8: Measurement of passive intermodulation generated by objects exposed to RF radiation
This part of IEC 62037 defines a radiated passive intermodulation (PIM) test to determine PIM levels generated by a device or object when it is exposed to RF radiation. This test can be conducted on...