DSF/PREN IEC 60749-5
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 11 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
scope:
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test method is considered destructive
Document History
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test...
DSF/PREN IEC 60749-5
Semiconductor devices – Mechanical and climatic test methods – Part 5: Steady-state temperature humidity bias life test
This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments. This test...