IEC - TS 62607-6-20
Nanomanufacturing – Key control characteristics – Part 6-20: Graphene-based material – Metallic impurity content: Inductively coupled plasma mass spectrometry
| Organization: | IEC |
| Publication Date: | 1 October 2022 |
| Status: | active |
| Page Count: | 32 |
| ICS Code (Nanotechnologies): | 07.120 |
scope:
This part of IEC TS 62607 establishes a standardized method to determine the chemical key control characteristic
- metallic impurity content
for powders of graphene-based materials by
- inductively coupled plasma mass spectrometry (ICP-MS).
The metallic impurity content is derived by the signal intensity of measured elements through MS spectrum of ICP-MS.
- The method is applicable for powder of graphene and related materials, including bilayer graphene (2LG), trilayer graphene (3LG), few-layer graphene (FLG), reduced graphene oxide (rGO) and graphene oxide (GO).
- The typical application area is in the microelectronics industry, e.g. conductive pastes, displays, etc., for manufacturers to guide material design, and for downstream users to select suitable products.
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