BSI - BS IEC 63284
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
active, Most Current
| Organization: | BSI |
| Publication Date: | 30 November 2022 |
| Status: | active |
| Page Count: | 16 |
| ICS Code (Transistors): | 31.080.30 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS IEC 63284
November 30, 2022
Semiconductor devices - Reliability test method by inductive load switching for gallium nitride transistors
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