CEI - EN IEC 61967-4
Integrated circuits - Measurement of electromagnetic emissions Part 4: Measurement of conducted emissions - 1 Ω /150 Ω direct coupling method
active, Most Current
| Organization: | CEI |
| Publication Date: | 1 January 2022 |
| Status: | active |
| Page Count: | 52 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe and RF voltage measurement using a 150 Ω coupling network. These methods ensure a high degree of reproducibility and correlation of EME measurement results.
Document History
EN IEC 61967-4
January 1, 2022
Integrated circuits - Measurement of electromagnetic emissions Part 4: Measurement of conducted emissions - 1 Ω /150 Ω direct coupling method
This part of IEC 61967 specifies a method to measure the conducted electromagnetic emission (EME) of integrated circuits by direct radio frequency (RF) current measurement with a 1 Ω resistive probe...
October 1, 2017
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
A description is not available for this item.
March 1, 2009
Integrated circuits - Measurement of electromagnetic emissions, 150 kHz to 1 GHz Part 4: Measurement of conducted emissions - 1 ohm/150 ohm direct coupling method
La presente Norma comprende Il testo della Norma CEI EN 61967-4:2002-12 e della sua Modifica CEI EN 61967-4/A1:2009-03 e relativo Corrigendum CEI EN 61967-4/A1/EC:2009-03, recepiti mediante...