IEC - 63364-1
Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
active, Most Current
| Organization: | IEC |
| Publication Date: | 1 December 2022 |
| Status: | active |
| Page Count: | 28 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 63364 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation detection system based on IoT in the block diagram, the characterization parameters, symbols, test setups and the conditions. In addition, this document defines the configuration items and criteria of standard space and firing situation for the quality evaluation measurement of sound field variation detection system with IoT.
Document History
63364-1
December 1, 2022
Semiconductor devices – Semiconductor devices for IoT system – Part 1: Test method of sound variation detection
This part of IEC 63364 specifies terms, the test method, and the report of sound variation detection system based on IoT. It provides the evaluation method for each part of the sound variation...