BSI - BS EN IEC 62951-9
Semiconductor devices - Flexible and stretchable semiconductor devices Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
active, Most Current
| Organization: | BSI |
| Publication Date: | 31 December 2022 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS EN IEC 62951-9
December 31, 2022
Semiconductor devices - Flexible and stretchable semiconductor devices Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells
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