DIN EN IEC 60749-37
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 February 2023 |
| Status: | inactive |
| Page Count: | 42 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN IEC 60749-37
February 1, 2023
Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer (IEC 47/2651/CDV:2020); German and English version prEN IEC 60749-37:2020
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