AENOR - UNE-EN IEC 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
active, Most Current
| Organization: | AENOR |
| Publication Date: | 1 May 2022 |
| Status: | active |
| Page Count: | 57 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN IEC 60749-28
May 1, 2022
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic discharge (ESD) sensitivity testing - Charged device model (CDM) - device level (Endorsed by Asociación Española de Normalización in May of 2022.)
A description is not available for this item.