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IPC/JEDEC J-STD-035A

Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Devices

active, Most Current
Organization: IPC
Publication Date: 1 December 2022
Status: active
Page Count: 26
scope:

This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic devices. This method provides users with an acoustic microscopy process flow for detecting anomalies (delaminations, cracks, mold compound voids, etc.) nondestructively in encapsulated electronic devices while achieving reproducibility.

Document History

IPC/JEDEC J-STD-035A
December 1, 2022
Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Devices
This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic devices. This method provides users with an acoustic microscopy process flow for...
April 1, 1999
Acoustic Microscopy for Non-Hermetic Encapsulated Electronic Components
This test method defines the procedures for performing acoustic microscopy on non-hermetic encapsulated electronic components. This method provides users with an acoustic microscopy process flow for...

References

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