IEC - 60747-5-16
Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
active, Most Current
| Organization: | IEC |
| Publication Date: | 1 March 2023 |
| Status: | active |
| Page Count: | 22 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
scope:
This part of IEC 60747 specifies the measuring method of flat-band voltage of single GaN-based light emitting diode (LED) die or package without phosphor, based on the photocurrent (PC) spectroscopy. White LEDs for lighting applications are out of the scope of this part of IEC 60747.
Document History
60747-5-16
March 1, 2023
Semiconductor devices – Part 5-16: Optoelectronic devices – Light emitting diodes – Test method of the flat-band voltage of GaN-based light emitting diodes based on the photocurrent spectroscopy
This part of IEC 60747 specifies the measuring method of flat-band voltage of single GaN-based light emitting diode (LED) die or package without phosphor, based on the photocurrent (PC) spectroscopy....