AENOR - UNE-EN 60749-23/A1
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
active, Most Current
| Organization: | AENOR |
| Publication Date: | 21 December 2011 |
| Status: | active |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
UNE-EN 60749-23/A1
December 21, 2011
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
A description is not available for this item.
March 16, 2005
Semiconductor devices - Mechanical and climatic test methods -- Part 23: High temperature operating life
A description is not available for this item.