BSI - BS IEC 63229
Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
active, Most Current
| Organization: | BSI |
| Publication Date: | 31 August 2023 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Semiconductor devices): | 31.080 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
BS IEC 63229
August 31, 2023
Semiconductor devices - Classification of defects in gallium nitride epitaxial film on silicon carbide substrate
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