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GSFC-S-311-M-70 REV D

Specification for the Performance of Destructive Physical Analyses (DPA)

active, Most Current
Organization: GSFC
Publication Date: 29 June 2015
Status: active
Page Count: 18
scope:

Scope.

This specification establishes the general requirements to be used in the performance of Destructive Physical Analysis (DPA) for Electrical, Electronic, and Electromechanical (EEE) parts. Performance of the testing required by this specification is intended to verify part lot conformance with applicable specifications and standards.

Document History

GSFC-S-311-M-70 REV D
June 29, 2015
Specification for the Performance of Destructive Physical Analyses (DPA)
Scope. This specification establishes the general requirements to be used in the performance of Destructive Physical Analysis (DPA) for Electrical, Electronic, and Electromechanical (EEE) parts....
GSFC-S-311-M-70 REV B
February 9, 2009
SPECIFICATION FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
This specification establishes the general requirements to be used in the performance of Destructive Physical Analysis (DPA) for Electrical, Electronic, and Electromechanical (EEE) parts. Performance...
GSFC-S-311-M-70
January 7, 1991
SPECIFICATION FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
PURPOSE The purpose of this document is to describe the general requirements for performance of destructive physical analysis (DPA) on samples of parts. This specification will identify the tests to...
GSFC-S-311-M-70
November 29, 1990
SPECIFICATION FOR DESTRUCTIVE PHYSICAL ANALYSIS (DPA)
A description is not available for this item.

References

This document references:
ESD S20.20 - the Development of an Electrostatic Discharge Control Program for - Protection of Electrical and Electronic Parts, Assemblies, and Equipment (Excluding Electrically Initiated Explosive Devices)
Published by ESD on June 11, 2014
This document applies to activities that manufacture, process, assemble, install, package, label, service, test, inspect, transport or otherwise handle electrical or electronic parts, assemblies and...
This document references:
MIL-STD-1580 - DESTRUCTIVE PHYSICAL ANALYSIS FOR ELECTRONIC, ELECTROMAGNETIC, AND ELECTROMECHANICAL PARTS
Published by NPFC on October 31, 2019
Scope. This standard describes the general requirements for performance of destructive physical analysis (DPA) on samples of parts. In addition to the requirements for the analysis procedures, the...
This document references:
MIL-STD-202 - TEST METHOD STANDARD ELECTRONIC AND ELECTRICAL COMPONENT PARTS
Published by NPFC on February 6, 1956
A description is not available for this item.
This document references:
MIL-STD-750F CHANGE 3 - TEST METHODS FOR SEMICONDUCTOR DEVICES
Published by DLA on April 1, 2021
Purpose. This standard establishes uniform methods and procedures for testing semiconductor devices suitable for use within Military and Aerospace electronic systems. The methods and procedures in...
This document references:
MIL-STD-883 - TEST METHOD STANDARD MICROCIRCUITS
Published by NPFC on September 16, 2019
Purpose. This standard establishes uniform methods, controls, and procedures for testing microelectronic devices suitable for use within Military and Aerospace electronic systems including basic...
This document is referenced by:
GSFC-S-311-P-813 REV C - RESISTOR, FIXED, LOW TEMPERATURE CHARACTERISTIC, PRECISION, RADIAL-LEAD
Published by GSFC on August 16, 1999
This specification covers the procurement requirements for fixed, low temperature coefficient, precision radial-leaded resistors. These resistors are intended for use in NASA/GSFC space system...
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