scope:

This document identifies information to be collected and reported to an analyst by a user of surface analysis services regarding the selection and preparation of samples presented for surface analysis. Such information is required to ensure that the sample has been selected, processed, handled, and stored in a manner consistent with the analysis objective to insure the reliability and reproducibility of the analyses. This information should also appear, as appropriate to the analyses and planned data use, in a data record book, datasheets, certificates of analysis, reports or other publications. This information should be in addition to other details associated with the specimens to be analyzed, including synthesis/source information, processing history and other characterization that will become part of the data record (sometimes identified as provenance information) regarding the source of the material and any changes to its original form.

This document also includes informative annexes as an aid in understanding the special sample handling requirements of surface chemical analysis techniques, particularly: Auger electron spectroscopy (AES), Secondary ion mass spectrometry (SIMS), and X-ray photoelectron spectroscopy (XPS or ESCA). The information presented may also be applicable for other analytical techniques, such as Total reflection X-ray fluorescence spectroscopy (TXRF), that are sensitive to surface composition and Scanning probe microscopy (SPM), that are sensitive to surface morphology.

This document does not define the nature of instrumentation or operating procedures needed to ensure that the analytical measurements described have been appropriately conducted.