SNV - SN EN 62374-1
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for intermetal layers
active, Most Current
| Organization: | SNV |
| Publication Date: | 1 November 2010 |
| Status: | active |
| Page Count: | 18 |
| ICS Code (Semiconductor devices): | 31.080 |
Document History
SN EN 62374-1
November 1, 2010
Semiconductor devices - Part 1: Time-dependent dielectric breakdown (TDDB) test for intermetal layers
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