scope:

This part of IEC 62899 specifies a method to measure values of effective charge carrier mobility in printed semiconductive layers using space charge limited current (SCLC) mobility technique. The described method is intended to be used as a benchmark test to allow reproducible measurements at a given temperature of the apparent charge carrier mobility for comparison with devices that use different materials, material formulations and fabrication processes for a planar configuration. This standard specifies the sample and equipment requirements, as well as describes the measurement technique, the data analysis procedure and the reporti ng protocol. This standard is suitable to test unipolar devices (i.e. hole-only or electron-only), where charge injection is efficient and where series resistance does not dominate the current-voltage curve. Therefore, it should not be used for testing high-electron mobility devices where electron injection can be problematic, for testing highly doped materials where space charge limited current does not exist, nor to evaluate mobility in applications that require lateral charge transport, such as in transistors