DS/ISO/TS 13278
Nanotechnologies – Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry
inactive
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| Organization: | DS |
| Publication Date: | 11 January 2012 |
| Status: | inactive |
| Page Count: | 26 |
| ICS Code (Physics. Chemistry): | 07.030 |
scope:
This Technical Specification provides methods for the determination of residual elements other than carbon in samples of single-wall carbon nanotubes (SWCNTs) and multiwall carbon nanotubes (MWCNTs) using inductively coupled plasma mass spectrometry (ICP-MS). The purpose of this Technical Specification is to provide optimized digestion and preparation procedures for SWCNT and MWCNT samples in order to enable accurate and quantitative determinations of elemental impurities using ICP-MS.
Document History
December 12, 2017
Nanotechnologies – Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry
ISO/TS 13278:2017 provides methods for the determination of residual elements other than carbon in samples of single-wall carbon nanotubes (SWCNTs) and multiwall carbon nanotubes (MWCNTs) using...
DS/ISO/TS 13278
January 11, 2012
Nanotechnologies – Determination of elemental impurities in samples of carbon nanotubes using inductively coupled plasma mass spectrometry
This Technical Specification provides methods for the determination of residual elements other than carbon in samples of single-wall carbon nanotubes (SWCNTs) and multiwall carbon nanotubes (MWCNTs)...