VDI/VDE 2655 BLATT 1.1
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
active, Most Current
| Organization: | VDI |
| Publication Date: | 1 January 2024 |
| Status: | active |
| Page Count: | 41 |
| ICS Code (Optical equipment): | 37.020 |
| ICS Code (Optics and optical measurements in general): | 17.180.01 |
Document History
VDI/VDE 2655 BLATT 1.1
January 1, 2024
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
A description is not available for this item.
March 1, 2008
Optical measurement and microtopographies - Calibration of interference microscopes and depth measurement standards for roughness measurement
The present guideline VDI/VDE 2655 Part 1.1 applies to interference microscopes used for measuring the topography of industrial surfaces. The calibration procedures described are comparable to the...