scope:

QUALIFIED PRODUCT LIST OF PRODUCTS QUALIFIED UNDER PERFORMANCE SPECIFICATION MIL-PRF-19500 Semiconductor Devices, General Specification for

This list has been prepared for use by or for the Government in the acquisition of products covered by the subject specification and such listing of a product is not intended to and does not connote endorsement of the product by the Department of Defense. This list is subject to change without notice; revision or amendment of this list will be issued as necessary. The listing of a product does not release the contractor from compliance with the specification requirements.

THE ACTIVITY RESPONSIBLE FOR THIS QUALIFICATION DATASET is the DLA Land and Maritime - VQ, Columbus, OH 43218-3990.DLA Land and Maritime-VQ supplemental information, This listing of discrete semiconductors applies only to products produced on the MIL-PRF-19500 certified/approved line(s) at the plant(s) listed at the back of the QML for the applicable manufacturer. The number in parenthesis next to some manufacturers' listings correlates to the plant(s) listed for the manufacturer. Therefore, only those products that have been fabricated, assembled, and tested on the certified/qualified lines herein can be supplied as qualified products.

The parts listing indicates the certification/approval status for each manufacturer. This can be found in the "Certification Status" column which accompanies each part listing. There are four possible certification/approval options. The following list identifies each certification/approval option and the abbreviation used in this listing:

C - Certification to the Quality Management Program outlined in Appendix C

TC - Transitional Certification to the Quality Management Program outlined in Appendix C

D - Certification to the Quality Program of Appendix D

DMS - Approval to the Diminishing Manufacturing Sources (DMS) provisions in MIL-PRF-19500

In addition to the options for certification there are two levels of certification; JAN, JANTX, JANTXV certification and JANS certification. The transitional certification to Appendix C option is for manufacturers in the process of making the transition from their previously certified Appendix D certification to an Appendix C certification. Manufacturers not able to comply with the certification requirements of either appendix C or D may be granted a DMS approval. DMS approvals are intended to provide a qualified source of supply for difficult procurement situations. Please refer to the latest revision of MIL-PRF-19500 for details.

MIL-PRF-19500 Appendix C contains provisions for test optimization for all listed processes and products for all device classes. Under these provisions traditional screens and Conformance Inspections (CI) can be optimized if found to be non-value added through the manufacturers up front controls and monitors in the wafer fabrication, assembly, and test areas as well as by design. Optimization of these screens and inspections in no way adversely affects the devices' military form, fit, and function. Regardless of screening or CI testing optimization, the manufacturer is still responsible for supplying products capable of passing any screening or CI tests prescribed in MIL-PRF-19500 and in the performance specification sheet.

1. The Government designation includes the JAN prefix:

* - Includes JAN and JANTX quality levels

** - Includes JAN, JANTX and JANTXV quality levels

S - Includes JANS quality level only

V - Includes JANTXV quality level only

+ - Includes JANTX quality level only

++ - Includes JANTX and JANTXV quality levels only

JANHC - Includes JANHC quality level only

JANKC - Includes JANKC quality level only

2. Radiation Hardness Assurance (RHA) levels:

M - Total ionizing dose 3*10 3 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

D - Total ionizing dose 1*10 4 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

P - Total ionizing dose 3*10 4 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2) (Unless otherwise specified)

L - Total ionizing dose 5*10 4 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

R - Total ionizing dose 1*10 5 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

F - Total ionizing dose 3*10 5 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

G - Total ionizing dose 5*10 5 (RAD(Si) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

H - Total ionizing dose 1*10 6 (RAD(Si)) Neutron fluence 2*10 12 (N/cm 2 ) (Unless otherwise specified)

Note: Government type designation will include product assurance level "V" or "S" followed by RHA level. The RHA level listed is the maximum level achieved during qualification testing. Manufacturer may supply any RHA level less than or equal to that listed.)

3. Electrostatic Discharge (ESD) Sensitivity Classifications:

Class 0: Less than 250V Class 1A: 250V - 499V

Class 1B: 500V - 999V Class 1C: 1,000V - 1,999V

Class 1: 0V - 1,999V Class 2: 2,000V - 3,999V

Class 3A: 4,000V - 7,999V

Class 3B: 8,000V - 15,999V

Class 3: 4,000V - 15,999V

Non-sensitive: Above 15,999V

4. These notes will apear next to the part number when applicable:

1/ Manufacturer has issued an end of life buy notice for these device types. Contact manufacturer for further information.

3/ Traceable die bank being utilized.

4/ These device types have been declared "Inactive for New Design". Refer to the applicable notice for the date of inactivation. The listings for these device types will be maintained until acquisition of the product is no longer required.

5/ Manufacturer is no longer undergoing periodic surveillance by the Qualifying Activity at this time.