BSI - 24/30465997 DC
Draft BS ISO 17297 Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary
pending, Most Current
| Organization: | BSI |
| Publication Date: | 23 January 2024 |
| Status: | pending |
| Page Count: | 34 |
| ICS Code (Image technology (Vocabularies)): | 01.040.37 |
Document History
24/30465997 DC
January 23, 2024
Draft BS ISO 17297 Microbeam analysis - Focused ion beam application for TEM specimen preparation - Vocabulary
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