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BSI - 24/30486622 DC

Draft BS EN IEC 62047-49 Semiconductor devices - Micro-electromechanical devices Part 49: Reliability test methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever

pending, Most Current
Organization: BSI
Publication Date: 1 February 2024
Status: pending
Page Count: 11
ICS Code (Semiconductor devices): 31.080
ICS Code (Other semiconductor devices): 31.080.99

Document History

24/30486622 DC
February 1, 2024
Draft BS EN IEC 62047-49 Semiconductor devices - Micro-electromechanical devices Part 49: Reliability test methods of electro-mechanical conversion characteristics of piezoelectric MEMS cantilever
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