SAE International - J1752/2_199503
ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS DIAGNOSTIC PROCEDURE 1 MHZ TO 1000 MHZ, MAGNETIC FIELD—LOOP PROBE
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| Organization: | SAE International |
| Publication Date: | 1 March 1995 |
| Status: | active |
description:
This SAE Recommended Practice defines a method for evaluating the near field magnetic component of the electromagnetic radiation from an integrated circuit. The method uses a shielded, single turn... View More
Document History
September 16, 2016
Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique...
June 24, 2011
Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique...
January 21, 2003
Measurement of Radiated Emissions from Integrated Circuits—Surface Scan Method (Loop Probe Method) 10 MHz to 3 GHz
This SAE Recommended Practice defines a method for evaluating the near field electric or magnetic component of the electromagnetic field at the surface of an integrated circuit (IC). This technique...
J1752/2_199503
March 1, 1995
ELECTROMAGNETIC COMPATIBILITY MEASUREMENT PROCEDURES FOR INTEGRATED CIRCUITS—INTEGRATED CIRCUIT RADIATED EMISSIONS DIAGNOSTIC PROCEDURE 1 MHZ TO 1000 MHZ, MAGNETIC FIELD—LOOP PROBE
This SAE Recommended Practice defines a method for evaluating the near field magnetic component of the electromagnetic radiation from an integrated circuit. The method uses a shielded, single turn...