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CEI EN 60444-8

Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units

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Organization: CEI
Publication Date: 1 February 2004
Status: inactive
Page Count: 18
scope:

Norma recepita mediante l'annuncio su CEINFORMA febbraio 2004.

Document History

December 1, 2017
Measurement of quartz crystal unit parameters Part 8: Test fixture for surface mounted quartz crystal units
This part of IEC 60444 describes test fixtures suitable for leadless surface mounted quartz crystal units in enclosures as defined in IEC 61837 (all parts). These fixtures allow the measurement of...
CEI EN 60444-8
February 1, 2004
Measurement of quartz crystal unit parameters - Part 8: Test fixture for surface mounted quartz crystal units
Norma recepita mediante l'annuncio su CEINFORMA febbraio 2004.

References

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