UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

ITU-T - O.173

(Pre-Published) Jitter measuring equipment for digital systems which are based on the Optical Transport Network (OTN)

active, Most Current
Organization: ITU-T
Publication Date: 1 February 2012
Status: active
Page Count: 17
scope:

This Recommendation specifies test instrumentation that is used to generate and measure timing jitter in digital systems based on the Optical Transport Network (OTN).

The test instrumentation consists principally of a jitter measurement function and a jitter generation function. Measurements can be performed at the physical layer of OTN network node interfaces (NNIs). A bit error rate test set may also be required for certain types of measurements; this may be part of the same instrumentation or it may be physically separate.

It is recommended that [ITU-T G.8251] and [ITU-T G.709] are read in conjunction with this Recommendation.

Document History

O.173
February 1, 2012
(Pre-Published) Jitter measuring equipment for digital systems which are based on the Optical Transport Network (OTN)
This Recommendation specifies test instrumentation that is used to generate and measure timing jitter in digital systems based on the Optical Transport Network (OTN). The test instrumentation...

References

Advertisement