AFNOR - NF EN 60749-7
Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 1 February 2012 |
| Status: | active |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
NF EN 60749-7
February 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 7 : internal moisture content measurement and the analysis of other residual gases
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