scope:

The present document contains the Profile Test Specification (PTS) and the Test Case Library (TCL) for "New Generation DECT; Part 3: Extended wideband speech" (TS 102 527-3). The present document covers both the Portable (PT) and the Fixed (FT) Radio terminations.

The Test Case Library (TCL) covers also some test cases for "DECT New Generation; part 1; Wideband speech" (TS 102 527-1) and for the "Generic Access Profile" (EN 300 444). This is done because such test cases are mandatory or especially relevant for New Generation DECT part 3 (see TS 102 527-3), and are not covered by existing GAP test specifications.

Due to the ascending compatibility of DECT profiles, all New Generation DECT part 3 devices (see TS 102 527-3) are required to be also compliant with "DECT New Generation; part 1; Wideband speech" (TS 102 527-1) and with the "Generic Access Profile" (GAP, EN 300 444). Annex D of the present document specifies the modifications to GAP test cases for requirements and tests that are optional in GAP test specifications (see note), but that become mandatory by the support of the corresponding GAP features in New Generation DECT Part 3.

NOTE: The industry de-facto standard practice for insuring the compliance to GAP is the use of TBR 022 amended by TBR 022/A1, even when these two documents do not have any longer their initial regulatory signification. TBR 022 relies on the GAP Profile Test Specification (EN 300 494 parts 1 to 3) and on the DECT Test Case Library (EN 300 497 parts 1 to 9). GAP test suite includes also the GAP Profile Implementation Conformance Statement (PICS) (EN 300 474 parts 1 and 2) and the DECT Common Interface (CI) Profile Implementation Conformance Statement (PICS) (EN 300 476 parts 1 to 7).

The objective of the present document is to provide a basis for approval tests of NG-DECT Part 3 equipment giving a high probability of air interface inter-operability between different manufacturer's DECT equipment.