DIN EN 60749-28
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 July 2012 |
| Status: | inactive |
| Page Count: | 46 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-28
July 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 28: Electrostatic Discharge (ESD) Sensitivity Testing - Direct contact charged device model (DC-CDM) (IEC 47/2123/CD:2012)
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