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DIN EN 60749-42

Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)

inactive, Most Current
Organization: DIN
Publication Date: 1 July 2012
Status: inactive
Page Count: 14
ICS Code (Semiconductor devices in general): 31.080.01

Document History

DIN EN 60749-42
July 1, 2012
Semiconductor devices - Mechanical and climatic test methods - Part 42: Temperature humidity storage (IEC 47/2131/CD:2012)
A description is not available for this item.
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