scope:

This part of IEC 61010 applies to hand-held and hand-manipulated PROBE ASSEMBLIES of the types described below, and related accessories which are intended for professional, industrial process, and educational use. These PROBE ASSEMBLIES are for use in the interface between an electrical phenomenon and test or measurement equipment. They may be fixed to the equipment or be detachable accessories for the equipment.

a) Low-voltage and high-voltage, non-attenuating PROBE ASSEMBLIES(type A). Non-attenuating PROBE ASSEMBLIES that are RATED for direct connection to voltages exceeding 33 V r.m.s. or 46,7 V peak or 70 V d.c., but not exceeding 63 kV. They do not incorporate active components, nor are they intended to provide a voltage divider function or a signal conditioning function, but they may contain passive non-attenuating components such as fuses.

b) High-voltage attenuating or divider PROBE ASSEMBLIES(typeB). Attenuating or divider PROBE ASSEMBLIES that are RATED for direct connection to secondary voltages exceeding 1 kV but not exceeding 63 kV. The divider function may be carried out wholly within the PROBE ASSEMBLY, or partly within the test or measurement equipment to be used with the PROBE ASSEMBLY.

c) Low-voltage attenuating or divider PROBE ASSEMBLIES(type C). Attenuating, divider or other signal conditioning PROBE ASSEMBLIES for direct connection to voltages exceeding 33 V r.m.s or 46,7 V peak or 70 V d.c., but not exceeding 1 kV r.m.s. or 1,5 kV d.c. The signal conditioning function may be carried out wholly within the PROBE ASSEMBLY, or partly within the test or measurement equipment intended to be used with the PROBE ASSEMBLY.

d) Low-voltage attenuating and non-attenuating PROBE ASSEMBLIES(type D), that are RATED for direct connection only to voltages not exceeding 33 V r.m.s., or 46,7 V peak, or 70 V d.c., and are suitable for currents exceeding 8 A.