DSF/FprEN 60444-6
Measurement of quartz crystal unit parameters -- Part 6: Measurement of drive level dependence (DLD)
inactive
| Organization: | DS |
| Status: | inactive |
| Page Count: | 19 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
1.1 Scope This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the p-network according IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. "Reference Method B", based on the pnetwork or reflection method according IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. "Method C", an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
Document History
October 14, 2013
Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
IEC 60444-6:2013 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods and one referential method are described. This edition includes the following...
October 22, 1997
Measurement of quartz crystal unit parameters – Part 6: Measurement of drive level dependence (DLD)
This part of IEC 444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods are described. Method A, based on the pi-network method according to IEC...
DSF/FprEN 60444-6
Measurement of quartz crystal unit parameters -- Part 6: Measurement of drive level dependence (DLD)
1.1 Scope This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method...