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ITU-T K.94

Mutual disturbance test method for evaluating performance degradation of converged terminal devices

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Organization: ITU-T
Publication Date: 1 May 2012
Status: active
Page Count: 20
scope:

This Recommendation analyses the electromagnetic compatibility (EMC) disturbance between different modules in converged terminal devices and defines a conducted test method. As more and more converged devices appear on the market, this Recommendation will help the industry to analyse and reduce such disturbance. Furthermore, this mutual-disturbance test can be used as one of the immunity test items listed in [ITU-T K.34] and [ITU-T K.48] to determine the level of performance degradation.

This Recommendation only covers the EMC mutual-disturbance between the different modules in converged devices. Examples of such devices include: GSM/Wireless LAN converged devices, WCDMA/Wireless LAN converged devices, CDMA/Wireless LAN converged devices and GSM/CDMA converged devices.

Document History

ITU-T K.94
May 1, 2012
Mutual disturbance test method for evaluating performance degradation of converged terminal devices
This Recommendation analyses the electromagnetic compatibility (EMC) disturbance between different modules in converged terminal devices and defines a conducted test method. As more and more...

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