ECIA - EIA-364-70
TP-70B Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
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| Organization: | ECIA |
| Publication Date: | 1 June 2007 |
| Status: | inactive |
| Page Count: | 21 |
Document History
May 1, 2021
TP-70D Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
This procedure establishes the test procedures for determining temperature rise versus current for connectors and sockets with conductor sizes equal to or less than 0000 AWG or equivalent.
July 1, 2014
TP-70C Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
This procedure establishes the test procedures for determining temperature rise versus current for connectors and sockets with conductor sizes equal to or less than 0000 AWG or equivalent.
June 1, 2007
TP-70B TEMPERATURE RISE VERSUS CURRENT TEST PROCEDURE FOR ELECTRICAL CONNECTORS AND SOCKETS
This procedure establishes the test procedures for determining temperature rise versus current for connectors and sockets with conductor sizes equal to or less than 0000 AWG or equivalent.
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EIA-364-70
June 1, 2007
TP-70B Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
A description is not available for this item.
May 1, 1998
TP-70A Temperature Rise Versus Current Test Procedure for Electrical Connectors and Sockets
A description is not available for this item.
January 1, 1992
TP-70 Test Procedure for Current vs Temperature Rise of Electrical Connectors
A description is not available for this item.