CEI EN 61967-8
Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
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| Organization: | CEI |
| Publication Date: | 1 November 2012 |
| Status: | active |
| Page Count: | 24 |
| ICS Code (Integrated circuits. Microelectronics): | 31.200 |
scope:
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range of 150 kHz up to 3 GHz. The IC being evaluated is mounted on an EMC test board (PCB) between the active conductor and the ground plane of the IC stripline arrangement.
Document History
October 1, 2023
Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
This part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline. The IC being evaluated is mounted on an EMC test...
CEI EN 61967-8
November 1, 2012
Integrated circuits - Measurement of electromagnetic emissions Part 8: Measurement of radiated emissions - IC stripline method
The measurement procedure of this part of IEC 61967 defines a method for measuring the electromagnetic radiated emission from an integrated circuit (IC) using an IC stripline in the frequency range...