DS/EN 60444-3
Measurement of quartz crystal unit parameters by zero phase technique in a pi-Network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0
active, Most Current
| Organization: | DS |
| Publication Date: | 22 October 1997 |
| Status: | active |
| Page Count: | 42 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This report specifies a method for the measurement of the parameters of quartz crystal units using an inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy depending on the type of crystals for: a) frequency with a fractional accuracy ranging between 10-6 and 10-8; b) resistance with a fractional accuracy ranging between 2% and 5%; c) motional capacitance and motional inductance with a fractional accuracy ranging between 3% and 7%.
Document History
DS/EN 60444-3
October 22, 1997
Measurement of quartz crystal unit parameters by zero phase technique in a pi-Network - Part 3: Basic method for the measurement of two-terminal parameters of quartz crystal units up to 200 MHz by phase technique in a pi-network with compensation of the parallel capacitance C0
This report specifies a method for the measurement of the parameters of quartz crystal units using an inductance to compensate for the effects of C0 at the frequency of the crystal unit with accuracy...
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