DIN EN 60749-43
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan (IEC 47/2169/CD:2013)
inactive, Most Current
| Organization: | DIN |
| Publication Date: | 1 October 2013 |
| Status: | inactive |
| Page Count: | 63 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
DIN EN 60749-43
October 1, 2013
Semiconductor devices - Mechanical and climatic test methods - Part 43: Guidelines for IC reliability qualification plan (IEC 47/2169/CD:2013)
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