CEI EN 60749-27
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
active, Most Current
Buy Now
| Organization: | CEI |
| Publication Date: | 1 October 2013 |
| Status: | active |
| Page Count: | 8 |
| ICS Code (Semiconductor devices in general): | 31.080.01 |
Document History
CEI EN 60749-27
October 1, 2013
Semiconductor devices - Mechanical and climatic test methods Part 27: Electrostatic discharge (ESD) sensitivity testing - Machine model (MM)
A description is not available for this item.
May 1, 2007
Semiconductor devices - Mechanical and climatic test methods - Part 27: Electrostatic discharge (ESD) sensitivity testing Machine model (MM)
La presente Norma fa parte della serie IEC/CLC 60749 e si occupa di prove per valutare la sensibilità dei dispositivi a semiconduttori alle scariche elettrostatiche.
In particolare essa definisce una...