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ISO 15932

Microbeam analysis - Analytical electron microscopy - Vocabulary

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Organization: ISO
Publication Date: 15 December 2013
Status: active
Page Count: 28
ICS Code (Optical equipment): 37.020
ICS Code (Image technology (Vocabularies)): 01.040.37

Document History

ISO 15932
December 15, 2013
Microbeam analysis - Analytical electron microscopy - Vocabulary
A description is not available for this item.

References

This document references:
ISO 22493 - Microbeam analysis - Scanning electron microscopy - Vocabulary
Published by ISO on April 15, 2014
This International Standard defines terms used in the practice of scanning electron microscopy (SEM). It covers both general and specific concepts, classified according to their hierarchy in a...
This document references:
ISO 23833 - Microbeam analysis - Electron probe microanalysis (EPMA) - Vocabulary
Published by ISO on April 15, 2013
This International Standard defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a...
This document references:
ISO 10241-1 - Terminological entries in standards — Part 1: General requirements and examples of presentation
Published by ISO on April 15, 2011
This part of ISO 10241 specifies requirements for the drafting and structuring of terminological entries in standards, exemplified by terminological entries in ISO and IEC documents. Terms and other...
This document references:
ISO 10241-2 - Terminological entries in standards - Part 2: Adoption of standardized terminological entries
Published by ISO on August 15, 2012
This part of ISO 10241 addresses the introduction of standardized terminological entries into other cultural and linguistic environments, and in particular the adoption of internationally...
This document references:
704 - Terminology work — Principles and methods
Published by ISO on July 1, 2022
This document establishes the basic principles and methods for preparing and compiling terminologies both inside and outside the framework of standardization. It describes the links between objects,...
This document is referenced by:
ISO 25498 - Microbeam analysis - Analytical electron microscopy - Selected area electron diffraction analysis using a transmission electron microscope
Published by ISO on March 1, 2018
This document specifies the method of selected area electron diffraction (SAED) analysis using a transmission electron microscope (TEM) to analyse thin crystalline specimens. This document applies to...
This document is referenced by:
ISO 13794 - Ambient air — Determination of asbestos fibres — Indirect-transfer transmission electron microscopy method
Published by ISO on October 1, 2019
This document specifies a reference method using transmission electron microscopy for the determination of airborne asbestos fibres and structures in in a wide range of ambient air situations,...
This document is referenced by:
ISO 10312 - Ambient air — Determination of asbestos fibres — Direct transfer transmission electron microscopy method
Published by ISO on October 1, 2019
This document specifies a reference method using transmission electron microscopy for the determination of airborne asbestos fibres and structures in in a wide range of ambient air situations,...
This document is referenced by:
EN 17160 - Product category rules for ceramic tiles
Published by CEN on February 1, 2019
This document defines Product Category Rules (PCR) providing guidelines and rules for developing a type III environmental declaration (EPD) for ceramic tiles produced by extrusion and dry-pressing...
This document is referenced by:
BS ISO 25498 - TC - Tracked Changes (Redline) - Microbeam analysis — Analytical electron microscopy — Selected area electron diffraction analysis using a transmission electron microscope
Published by BSI on February 27, 2020
A description is not available for this item.
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