UNLIMITED FREE
ACCESS
TO THE WORLD'S BEST IDEAS

SUBMIT
Already a GlobalSpec user? Log in.

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

Customize Your GlobalSpec Experience

Finish!
Privacy Policy

This is embarrasing...

An error occurred while processing the form. Please try again in a few minutes.

AFNOR - NF C86-010/A2

Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.

active, Most Current
Organization: AFNOR
Publication Date: 1 July 1989
Status: active
Page Count: 2
ICS Code (Semiconductor devices in general): 31.080.01

Document History

NF C86-010/A2
July 1, 1989
Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification.
A description is not available for this item.
June 1, 1988
Semiconductor devices. Harmonized system of quality assessment for electronic components. Discrete semiconductor devices. Generic specification
A description is not available for this item.
Advertisement