IEC 60068-2-10
Basic environmental testing procedures – Part 2: Tests – Test J and guidance: Mould growth
inactive
Buy Now
| Organization: | IEC |
| Publication Date: | 1 April 1989 |
| Status: | inactive |
| Page Count: | 1 |
| ICS Code (Environmental testing): | 19.040 |
Document History
April 1, 2018
Environmental testing – Part 2-10: Tests – Test J and guidance: Mould growth
This part of IEC 60068 provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant...
April 1, 2018
AMENDMENT 1 Environmental testing – Part 2-10: Tests – Test J and guidance: Mould growth
A description is not available for this item.
June 1, 2005
Environmental testing – Part 2-10: Tests – Test J and guidance: Mould growth
This part of IEC 60068 provides a test method for determining the extent to which electrotechnical products support mould growth and how any mould growth may affect the performance and other relevant...
IEC 60068-2-10
April 1, 1989
Basic environmental testing procedures – Part 2: Tests – Test J and guidance: Mould growth
A description is not available for this item.
January 1, 1988
Basic Environmental Testing Procedures Part 2: Tests - Test J and Guidance: Mould Growth
A description is not available for this item.
January 1, 1984
Basic environmental testing procedures - Part 2 Tests – Test J Mould growth
General
This test covers the inoculation of assembled specimens with a selection of mould spores followed by a period of incubation under conditions which promote spore germination and the growth of...
January 1, 1968
Basic environmental testing procedures for electronic components and electronic equipment – Part 2: Tests – Test J: Mould growth
Object
To assess the extent of mould growth by a short exposure of 28 days 01 to assess the effect of mould growth on the functioning of the specimen by a longer exposure of 84 days.
Note –...
January 1, 1960
Basic environmental testing procedures for electronic components and electronic equipment – Part 2: Tests – Test J: Mould growth
Where it is desired to make comparative tests of the mould growth resistance of items tested at the same time, the following test should be applied