JEDEC JESD 22-A100
Cycled Temperature-Humidity-Bias Life Test
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| Organization: | JEDEC |
| Publication Date: | 1 July 2013 |
| Status: | inactive |
| Page Count: | 12 |
Document History
November 1, 2020
Cycled Temperature-Humidity-Bias with Surface Condensation Life Test
The Cycled Temperature-Humidity-Bias Life Test is typically performed on cavity packages, (e.g., MQUADs, lidded ceramic pin grid arrays, etc.) as an alternative to JESD22-A101 or JESD22-A110.
The...
JEDEC JESD 22-A100
July 1, 2013
Cycled Temperature-Humidity-Bias Life Test
A description is not available for this item.
October 1, 2007
Cycled Temperature-Humidity-Bias Life Test
The Cycled Temperature-humidity-bias Life Test is performed for the purpose of evaluating the reliability of nonhermetic packaged solid state devices in humid environments. It employs conditions of...
April 1, 2000
Cycled Temperature-Humidity-Bias Life Test
A description is not available for this item.
January 1, 1989
Test Method A100-A Cycled Temperature Humidity Bias Life Test
A description is not available for this item.