scope:

FOREWORD

Recently developed, high-resolution X-ray detectors such as lithium-drifted silicon and germanium have resulted in widespread application of nondiffractive (also called nondispersive) analysis as an alternative or complementary technique to X-ray emission spectrography (X-ray fluorescence analysis). This table has been prepared for use in nondiffractive analyses. All the X-ray emission lines shorter than 50 Å* have been tabulated in two basic arrangements. The first section of the table is a compilation of each line for each element arranged on the basis of increasing atomic number and increasing wavelength (decreasing energy) for the lines of each element. The second section of the table lists all the X-ray lines ordered on the basis of increasing wavelength (decreasing energy) regardless of element.

All lines shorter than 50 Å* that were used in the preparation of the second edition of X-ray Emission and Absorption Wavelengths and Two-Theta Tables, ASTM DS 37A, by E. W. White and G. G. Johnson, Jr., have been included in this table [1, 2].¹ Some of the very weak lines may not be observed in nondiffractive spectra, but most of the lines should be resolved in favorable cases.

¹ Italic numbers in brackets refer to the list of references at the end of the Foreword.