CEI EN 60444-6
Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
active, Most Current
Buy Now
| Organization: | CEI |
| Publication Date: | 1 April 2014 |
| Status: | active |
| Page Count: | 26 |
| ICS Code (Piezoelectric devices): | 31.140 |
scope:
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based on the π-network according to IEC 60444-1, can be used in the complete frequency range covered by this part of IEC 60444. "Reference Method B", based on the π- network or reflection method according to IEC 60444-1, IEC 60444-5 or IEC 60444-8 can be used in the complete frequency range covered by this part of IEC 60444. "Method C", an oscillator method, is suitable for measurements of fundamental mode crystal units in larger quantities with fixed conditions.
Document History
January 1, 2023
Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. “Method A”, based...
CEI EN 60444-6
April 1, 2014
Measurement of quartz crystal unit parameters Part 6: Measurement of drive level dependence (DLD)
This part of IEC 60444 applies to the measurements of drive level dependence (DLD) of quartz crystal units. Two test methods (A and C) and one referential method (B) are described. "Method A", based...
October 1, 1998
Misura dei parametri per unità a cristalli di quarzo - Parte 6: Misura della dipendenza del livello di eccitazione (DLD)
Norma recepita mediante l'annuncio su CEINFORMA ottobre 1998.LA PRESENTE PUBBLICAZIONE E' ACQUISTABILE TRAMITE RICHIESTA SPECIFICA DA INVIARE A: attivitacommerciali@ceiweb.it.