AFNOR - NF EN 62047-18
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials
active, Most Current
| Organization: | AFNOR |
| Publication Date: | 28 February 2014 |
| Status: | active |
| ICS Code (Semiconducting materials): | 29.045 |
| ICS Code (Other semiconductor devices): | 31.080.99 |
Document History
NF EN 62047-18
February 28, 2014
Semiconductor devices - Micro-electromechanical devices - Part 18 : bend testing methods of thin film materials
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